Hardware Security for Edge Computing Via CMOS-Compatible Multi-Level Flash Memory with Hash-Based Key Generation

Authors
Sim, KyuminSon, HyunseokYu, SeokjunHwang, Hae ChulSong, Jong HyunChris Baek, Seung-heonPark, Hamin
Issue Date
2025-11
Publisher
Wiley-VCH Verlag
Citation
Advanced Electronic Materials, v.11, no.19
Abstract
Ensuring secure and energy-efficient authentication of resource-constrained devices has become a critical challenge owing to the rapid expansion of the Internet of Things (IoT) ecosystem. Physically unclonable functions (PUFs) that exploit inherent manufacturing variations to generate device-unique keys have emerged as a promising hardware-based security primitive. In this study, a PUF architecture is proposed that utilizes multi-level programming of flash memory capacitors. Reliable and reproducible binary responses are generated across multiple programmed states by extracting flat-band voltage variations from capacitance–voltage measurements. Performance is evaluated using the uniformity, P-value, inter-Hamming distance, and intra-Hamming distance, which indicated strong randomness, uniqueness, and stability. To further enhance the entropy and cryptographic strength, a hash-based message authentication code (HMAC)-based key derivation function is integrated, which transformed the PUF outputs into high-entropy pseudorandom keys. The final architecture supported key generation with zero standby power and is compatible with commercially available memory structures, thereby enabling low-cost and scalable deployment in secure IoT systems. These results highlight the potential of multi-level memory-based PUFs as a lightweight and robust solution for next-generation hardware security.
Keywords
INTERNET; UNCLONABLE FUNCTIONS; AUTHENTICATION; TECHNOLOGIES; CHALLENGES; physically unclonable function (PUF); HMAC-based key derivation function (HKDF); multi-level; flash memory; hash-based message authentication code (HMAC)
URI
https://pubs.kist.re.kr/handle/201004/153512
DOI
10.1002/aelm.202500484
Appears in Collections:
KIST Article > 2025
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