Hardware Security for Edge Computing Via CMOS-Compatible Multi-Level Flash Memory with Hash-Based Key Generation
- Authors
- Sim, Kyumin; Son, Hyunseok; Yu, Seokjun; Hwang, Hae Chul; Song, Jong Hyun; Chris Baek, Seung-heon; Park, Hamin
- Issue Date
- 2025-11
- Publisher
- Wiley-VCH Verlag
- Citation
- Advanced Electronic Materials, v.11, no.19
- Abstract
- Ensuring secure and energy-efficient authentication of resource-constrained devices has become a critical challenge owing to the rapid expansion of the Internet of Things (IoT) ecosystem. Physically unclonable functions (PUFs) that exploit inherent manufacturing variations to generate device-unique keys have emerged as a promising hardware-based security primitive. In this study, a PUF architecture is proposed that utilizes multi-level programming of flash memory capacitors. Reliable and reproducible binary responses are generated across multiple programmed states by extracting flat-band voltage variations from capacitance–voltage measurements. Performance is evaluated using the uniformity, P-value, inter-Hamming distance, and intra-Hamming distance, which indicated strong randomness, uniqueness, and stability. To further enhance the entropy and cryptographic strength, a hash-based message authentication code (HMAC)-based key derivation function is integrated, which transformed the PUF outputs into high-entropy pseudorandom keys. The final architecture supported key generation with zero standby power and is compatible with commercially available memory structures, thereby enabling low-cost and scalable deployment in secure IoT systems. These results highlight the potential of multi-level memory-based PUFs as a lightweight and robust solution for next-generation hardware security.
- Keywords
- INTERNET; UNCLONABLE FUNCTIONS; AUTHENTICATION; TECHNOLOGIES; CHALLENGES; physically unclonable function (PUF); HMAC-based key derivation function (HKDF); multi-level; flash memory; hash-based message authentication code (HMAC)
- URI
- https://pubs.kist.re.kr/handle/201004/153512
- DOI
- 10.1002/aelm.202500484
- Appears in Collections:
- KIST Article > 2025
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