KIST Library Institutional Repository

플렉서블 기판상의 금속층 두께 측정방법

Author

한준현; 변지영; 지광구; 김윤배

Assignee

한국과학기술연구원

Regitration Date

2012-04-13

Registration No.

4970567

Application Date

2010-04-12

Application No.

2010-091275

Country

JA

URI

https://pubs.kist.re.kr/handle/201004/77608

Appears in Collections:

KIST Patent > Others

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