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dc.contributor.authorCristoloveanu, S.-
dc.contributor.authorBawedin, M.-
dc.contributor.authorNavarro, C.-
dc.contributor.authorChang, S.-J.-
dc.contributor.authorWan, J.-
dc.contributor.authorAndrieu, F.-
dc.contributor.authorLe, Royer C.-
dc.contributor.authorRodriguez, N.-
dc.contributor.authorGamiz, F.-
dc.contributor.authorZaslavsky, A.-
dc.contributor.authorKim, Y.T.-
dc.date.accessioned2024-01-12T06:53:35Z-
dc.date.available2024-01-12T06:53:35Z-
dc.date.created2022-03-07-
dc.date.issued2015-05-
dc.identifier.issn1938-5862-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/80277-
dc.description.abstractSeveral types of floating-body capacitorless 1T-DRAM memory cells with planar SOI or multi-gate configuration are reviewed and compared. We show that 1T-DRAMs are also compatible with the 'unified memory' paradigm which aims at combining, within a single SOI transistor, volatile, nonvolatile and multiple-state memory functionalities. We focus on our recently proposed concepts (MSDRAM, A2RAM and Z2-FET), by addressing the device architecture and fabrication, operating mechanisms, and scaling issues. Experimental results together with numerical simulations indicate the directions for performance optimization. ? The Electrochemical Society.-
dc.languageEnglish-
dc.publisherElectrochemical Society Inc.-
dc.titleSpecial memory mechanisms in SOI devices-
dc.typeConference-
dc.identifier.doi10.1149/06605.0201ecst-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSymposium on Advanced CMOS-Compatible Semiconductor Devices 17 - 227th ECS Meeting, pp.201 - 210-
dc.citation.titleSymposium on Advanced CMOS-Compatible Semiconductor Devices 17 - 227th ECS Meeting-
dc.citation.startPage201-
dc.citation.endPage210-
dc.citation.conferencePlaceUS-
dc.citation.conferenceDate2015-05-24-
dc.relation.isPartOfECS Transactions-
dc.identifier.scopusid2-s2.0-84931326209-
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KIST Conference Paper > 2015
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