KIST Library Institutional Repository

Measurement of complex permittivity of thin PCB substrate using open-ended coaxial probe

Issue Date

2004-11-01

Citation

KEES, pp.155 - 158

URI

https://pubs.kist.re.kr/handle/201004/82110

Appears in Collections:

KIST Conference Paper > 2004

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML