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응시 깊이 정보 추정 장치 및 방법

Author

강민구; 조대용; 박민규

Assignee

한국과학기술연구원

Regitration Date

2023-03-13

Registration No.

10-2511078

Application Date

2021-05-24

Application No.

10-2021-0066109

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/82362

Appears in Collections:

KIST Patent > 2021

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