DSpace at KISTKIST Conference PaperOthers

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dc.contributor.authorBaik, Young Joon-
dc.date.accessioned2024-01-12T11:10:37Z-
dc.date.available2024-01-12T11:10:37Z-
dc.date.created2022-01-14-
dc.date.issued1998-01-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85453-
dc.titleCharacterization of Thick Diamond Film Wafer Grown by Multi-Cathode Direct Current PACVD-
dc.typeConference-
dc.description.journalClass1-
dc.relation.isPartOfInt'l Workshop on Surface Engineering and Coatings-
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