KIST Library Institutional Repository

Characterization of Thick Diamond Film Wafer Grown by Multi-Cathode Direct Current PACVD

Authors

Baik, Young Joon

Issue Date

1998-01-01

URI

https://pubs.kist.re.kr/handle/201004/85453

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML