DSpace at KISTKIST Patent2019

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dc.contributor.author이택진-
dc.contributor.author전영민-
dc.contributor.author방재원-
dc.contributor.author유보선-
dc.contributor.author신범주-
dc.contributor.author김재헌-
dc.date.accessioned2024-01-12T11:37:12Z-
dc.date.available2024-01-12T11:37:12Z-
dc.date.issued2022-10-18-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85873-
dc.title위치 측정 방법 및 시스템-
dc.typePatent-
dc.date.registration2022-10-18-
dc.date.application2019-07-18-
dc.identifier.patentRegistrationNumber3557919-
dc.identifier.patentApplicationNumber17893784.3-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2019
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