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개방단말 동축선 프로브를 이용한 매질의 전기적 특성 측정 장치

Author

정지현; 이정학; 김세윤

Assignee

한국과학기술연구원

Regitration Date

2010-10-04

Registration No.

0986641

Application Date

2008-07-30

Application No.

2008-0074815

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/86991

Appears in Collections:

KIST Patent > 2008

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