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Electrical Characterization of Partially Depleted MoS2 Field-Effect Transistors

Authors

Dae-Young Jeon; Dong Su Lee; Seoung-Ki Lee; Min Park; So Jeong Park; Gyu-Tae kim

Publisher

6.17~22, 프랑스

Citation

European Materials Research Society (E-MRS)

Keywords

TMDs; Partially depleted; Bulk neutral mobility; Series resistance

URI

https://pubs.kist.re.kr/handle/201004/87212

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KIST Conference Paper > Others

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