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다시점 3D 디스플레이의 최적관찰거리(OVD) 측정방법

Author

윤기혁; 김성규

Assignee

한국과학기술연구원

Regitration Date

2017-11-21

Registration No.

9826221

Application Date

2015-05-05

Application No.

14/703993

Country

US

URI

https://pubs.kist.re.kr/handle/201004/89280

Appears in Collections:

KIST Patent > 2015

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