KIST Library Institutional Repository

비접촉식 샘플 높이 측정 시스템

Author

곽기성; 박민철

Assignee

한국과학기술연구원

Regitration Date

2019-10-29

Registration No.

10-2040017

Application Date

2018-08-08

Application No.

2018-0092168

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/91867

Appears in Collections:

KIST Patent > 2018

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