KIST Library Institutional Repository

반도체 재료의 도핑농도 측정방법 및 이를 이용한 컴퓨터 프로그램을 기록한 기록매체

Author

전대영; 이승기; 김태욱; 이동수; 김남동

Assignee

한국과학기술연구원

Regitration Date

2020-04-01

Registration No.

10-2098288

Application Date

2018-08-31

Application No.

10-2018-0103697

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/97613

Appears in Collections:

KIST Patent > 2018

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