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Electrical properties of amorphous hafnium-indium-zinc-oxide thin film transistors with highly conductive buried layer

Authors

Chong Eu Gene; Lee Sang Yeol

Citation

7th International Symposium on Transparent Oxide Thin Films for Electronics and Optics

URI

https://pubs.kist.re.kr/handle/201004/97960

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KIST Conference Paper > Others

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