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Temperature Induced Instability of Passivation-Free Amorphous Indium Zinc Oxide (a-IZO) Thin Film Transistor

Authors

Chong Eu Gene; Chun Yoon Soo; Jo Kyoungchul; Kim Seung Han; Jung Da Woon; Lee Sang Yeol

Citation

IMID 2010, pp.149

URI

https://pubs.kist.re.kr/handle/201004/99045

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KIST Conference Paper > Others

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