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Improved Temperature Dependence of Phase Change Memory Device Using Ge-doped SbTe

Authors

Wu Zhe; Park Young Wook; Hyung-Woo Ahn; Lee Suyoun; Jeung-hyun Jeong; Jeong, Doo Seok; Kwangsoo No; CHEONG, BYUNG KI

Citation

Material Research Society

URI

https://pubs.kist.re.kr/handle/201004/99071

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KIST Conference Paper > Others

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