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Showing results 1 to 6 of 6

Issue DateTitleAuthor(s)
-Actinic EUV Mask Inspection using Coherent EUV Source based on High-order Harmonic GenerationKim Yong Soo; Park June; Park Han Young; Hamin Sung; Jomsool Kim; Seung Beom Lee; Hyun Woo Cho; Ju Han Lee; Park, Min-Chul; Jhon, Young Min
-CD Measurements of EUV Mask using a Coherent Scattering Microscope Mask Inspection ToolKim Yong Soo; Park June; 성하민; 김점술; 이승범; 조현우; Park, Min-Chul; Cho, Woon Jo; Kim, Yong Tae; 이주한; Jhon, Young Min
-Characteristic Analysis of Coherent EUV Light Source based on High-order Harmonic GenerationKim Yong Soo; Park June; Kim Younghee; 성하민; 김점술; 이승범; 조현우; Cho, Woon Jo; Kim, Yong Tae; 이주한; Jhon, Young Min
-Characteristics of the Coherent EUV Light Source for EUV MetrologyKim Yong Soo; Kim Younghee; Park June; Hamin Sung; Jomsool Kim; Ju Han Lee; Jhon, Young Min
-Plasma assisted tunable exciton states in monolayer MoS2Kim Younghee; Jhon Young In; Park June; KIM, JAE HUN; Jhon, Young Min
2016-11Significant Exciton Brightening in Monolayer Tungsten Disulfides via Fluorination: n-Type Gas Sensing SemiconductorsJhon, Young In; Kim Younghee; Park June; Kim, Jae Hun; Lee, Taikjin; Seo, Minah; Jhon, Young Min
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