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Showing results 1 to 5 of 5

Issue Date	Title	Author(s)
-	Electrical Characterization of Partially Depleted MoS2 Field-Effect Transistors	Dae-Young Jeon; Dong Su Lee; Seoung-Ki Lee; Min Park; So Jeong Park; Gyu-Tae kim
-	In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs	Dae-Young Jeon; Tim Baldauf; So Jeong Park; Sebastian Pregl; Larysa Baraban; Gianaurelio Cuniberti; Thomas Mikolajick; Walter M. Weber
-	Less surface roughness scattering effects in highly doped Si-channel and ambipolar conduction behavior with Schottky-barrier contacts	Dae-Young Jeon; So Jeong Park; Gyu-Tae Kim; Gerard Ghibaudo; Sebastian Pregl; Thomas Mikolajick; Walter M. Weber
2019-04	Series Resistance Effects on the Back-gate Biased Operation of Junctionless Transistors	Dae-Young Jeon; So Jeong Park; Mireille Mouis; Sylvain Barraud; Gyu-Tae Kim; Gerard Ghibaudo
2019-04	Simple Method for Determining Channel Doping Concentration of Highly Doped FD-SOI Devices	So Jeong Park; Dae-Young Jeon; Gyu-Tae Kim

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