Physical model for low frequency noise in poly-Si resistors and thin-film transistors

Authors
Han, Il KiChoi, Won JunPark, Young JuCho, Woon JoLee, Jung IlMyoung-Bok LeeAlain ChovetJean BriniGerard Ghibaudo
Citation
The First International Symposium on Future Issues in Nano-optoelectronics, pp.32 - 33
Keywords
Low frequency noise; Polycrystalline-Si thin films; Resistors; Transistors; Thermal activation
URI
https://pubs.kist.re.kr/handle/201004/105989
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE