Structural and micromechanical characteristics of low-dielectric organosilicate thin films modified by NH₃ plasma treatment

Authors
차국헌주상현김수한심현상Kim Yong Tae한진희이진규윤도영
Citation
The Second Asian Conference on Chemical Vapor Deposition, pp.48 - 51
Keywords
low-k; MSQ; interconnection
URI
https://pubs.kist.re.kr/handle/201004/107632
Appears in Collections:
KIST Conference Paper > Others
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