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Effects of Y to Mn ratio on memory window in the YMnO₃ ferroelectic gate

Authors

Kim Yong Tae; PARK YOUNG KYUN; 장호정; 김희준; Akira Yoshida

Citation

The International Conference on Electrical Engineering 2000, pp.66 - 69

Keywords

YMnO₃

URI

https://pubs.kist.re.kr/handle/201004/108361

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KIST Conference Paper > Others

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