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Characterization of domain structures in epitaxial PZT thin films using synchrotron XRD

Authors

LEE KYEONG SEOK; 백성기

Citation

The 12th International Symposium on Integrated Ferroelectrics

Keywords

microstructure characterization; synchrotron x-ray diffraction; epitaxial PZT thin films

URI

https://pubs.kist.re.kr/handle/201004/108612

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KIST Conference Paper > Others

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