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Interfacial barrier for the electronic conduction in SrS:Cu, Cl Thin films

Authors

Ju Byeong Kwon; SHIN KYEONG SIK; OH MYUNG HWAN; LEE YUN HI

Citation

IC-STDP'1999

Keywords

ELD

URI

https://pubs.kist.re.kr/handle/201004/109498

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KIST Conference Paper > Others

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