Identification of automotive paints using time-of-flight secondary ion mass spectrometry

Authors
LEE YEON HEEHAN SEUNG HEE윤정현KIM YOUNG MAN손성건박성우
Citation
AA6, pp.80
Keywords
paint; TOF-SIMS; forensic; depth profile
URI
https://pubs.kist.re.kr/handle/201004/109831
Appears in Collections:
KIST Conference Paper > Others
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