KIST Library Institutional Repository

Structural characterization of epitaxial PLZT thin films

Authors

LEE KYEONG SEOK; 백성기

Citation

Proceedings of the 3rd DIM-CISEM Joint Seminar, Tokyo, Japan, August 6-7, 1998., pp.1 - 9

Keywords

domain structure; PZT; strain relaxation; x-ray diffraction

URI

https://pubs.kist.re.kr/handle/201004/109971

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML