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An improved understanding of the relationship between interface roughness of ZnS:Pr,Ce phosphor-Ta//2O//5 insulating film and electrical characteristics of TFEL devices

Authors

KIM YOUNG SIK; LEE YUN HI; Ju Byeong Kwon; OH MYUNG HWAN; 성만영; 신동기

Citation

Proc. SID '98, pp.659 - 662

Keywords

electroluminescent display(ELD)

ISSN

0098-0966

URI

https://pubs.kist.re.kr/handle/201004/110133

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KIST Conference Paper > Others

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