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Study of crystallographical defects of the GaN micro-crystals by Raman spectroscopy and X-ray diffraction

Authors

고의관; C.S. Park; 박일우; Park Young Ju; KIM EUN KYU; 조성호

Citation

The 9th Seoul International Symposium on the Physics of Semiconductors and Applications - 1998, pp.125 - 126

Keywords

GaN

URI

https://pubs.kist.re.kr/handle/201004/110292

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KIST Conference Paper > Others

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