Fabrication of in-plane gated transistor with electron-beam lighography technique

Authors
한철구김광무정석구최범호KIM EUN KYUMin Suk-KiPARK JEONG HO
Citation
Proc. 4th Korean conf. semiconductors., pp.437 - 438
Keywords
in-plane gated transistor; electron beam lithography; HEMT; MBE
URI
https://pubs.kist.re.kr/handle/201004/110936
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE