Direct quantum process tomography via measuring sequential weak values

Authors
Kim, YosepKim, Yong-SuLee, Sang-YunCho, Young-WookMoon, SungKim, Yoon-HoHan, Sang-Wook
Issue Date
2018-05
Publisher
IEEE
Citation
Conference on Lasers and Electro-Optics (CLEO)
Abstract
We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.
ISSN
2160-9020
URI
https://pubs.kist.re.kr/handle/201004/114369
Appears in Collections:
KIST Conference Paper > 2018
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