DSpace at KISTKIST Article2021

Advanced materials characterization using synchrotron radiation

Authors
Choi, J.W.; Seo, J.H.; Hwang, C.; Cho, B.I.; Lee, D.R.; Chang, Y.J.
Issue Date
2021-10
Publisher
Elsevier B.V.
Citation
Current Applied Physics, v.30, pp.1 - 3
Abstract
[No abstract available]
Keywords
Angle-resolved photoemission spectroscopy (ARPES); Synchrotron light sources; X-ray absorption spectroscopy (XAS); X-ray diffraction (XRD); X-ray magnetic circular dichroism (XMCD); X-ray photoelectron spectroscopy (XPS)
ISSN
1567-1739
URI
https://pubs.kist.re.kr/handle/201004/116305
DOI
10.1016/j.cap.2021.07.005
Appears in Collections:
KIST Article > 2021
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