Delayed emission from InGaAs/GaAs quantum dots grown by migration-enhanced epitaxy due to carrier localization in a wetting layer

Authors
An, C. S.Jang, Y. D.Lee, H.Lee, D.Song, J. D.Choi, W. J.
Issue Date
2013-05-07
Publisher
AMER INST PHYSICS
Citation
JOURNAL OF APPLIED PHYSICS, v.113, no.17
Abstract
Wetting layer (WL) photoluminescence (PL) at 10K dominated the PL spectra of low-density quantum dots (QDs) grown by migration-enhanced epitaxy (MEE), even at very low excitation powers. Long PL rise time at the ground state (GS) of QDs was observed, when carriers are generated in the WL, indicating suppressed carrier capture from the WL into the QDs. Fluctuations in the WL thickness due to WL thinning in the MEE-grown QDs produced strong localization effects. Temperature dependence of the WL PL intensity and the GS PL rise time agreed well with this interpretation. (C) 2013 AIP Publishing LLC.
Keywords
OPTICAL-PROPERTIES; TEMPERATURE; DEPOSITION; OPTICAL-PROPERTIES; TEMPERATURE; DEPOSITION
ISSN
0021-8979
URI
https://pubs.kist.re.kr/handle/201004/128066
DOI
10.1063/1.4803493
Appears in Collections:
KIST Article > 2013
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