Study of surface morphology and grain size of irradiated MgO thin films
- Authors
 - Singh, J.P.; Sulania, I.; Prakash, J.; Gautam, S.; Chae, K.H.; Kanjilal, D.; Asokan, K.
 
- Issue Date
 - 2012-04
 
- Publisher
 - VBRI Press
 
- Citation
 - Advanced Materials Letters, v.3, no.2, pp.112 - 117
 
- Abstract
 - Present work reports 200 MeV Ag15+ irradiation induced effects on the surface morphology, grain size and local electronic structure in MgO thin films deposited by e-beam evaporation under ultra High vacuum. The grain size was found to decrease from 37 nm (pristine film) to 23 nm for the sample irradiated with fluence of 1×1012 ions/cm2 and thereafter it increases upto fluence of 5×1012 ions/cm2. Similar changes with ion fluence were also observed for surface roughness. Shifting and disappearance of peaks in X-ray absorption spectra with irradiation shows the electronic structure modification after irradiation. The detailed analysis of observed results has been done on the basis of existing theories. ? 2012 VBRI Press.
 
- Keywords
 - Atomic force microscopy; MgO; X-ray absorption spectroscopy
 
- ISSN
 - 0976-3961
 
- URI
 - https://pubs.kist.re.kr/handle/201004/129420
 
- DOI
 - 10.5185/amlett.2012.1307
 
- Appears in Collections:
 - KIST Article > 2012
 
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