Effect of a hydrogen ratio in electrical and optical properties of hydrogenated Al-doped ZnO films

Authors
Tark, S. J.Ok, Y. -W.Kang, M. G.Lim, H. J.Kim, W. M.Kim, D.
Issue Date
2009-10
Publisher
SPRINGER
Citation
JOURNAL OF ELECTROCERAMICS, v.23, no.2-4, pp.548 - 553
Abstract
This study examined the effect of the hydrogen ratio on the electrical and optical properties of hydrogenated Al-doped zinc oxide (AZO) thin films deposited by rf magnetron sputtering using a ceramic target (98 wt% ZnO, 2 wt% Al2O3). Various AZO films on glass were prepared by changing the H-2/(Ar + H-2) ratio at room temperature. The AZO/H films showed a lower resistivity and a higher carrier concentration and mobility than the AZO films. However, the resistivity and mobility of the AZO/H films increased and decreased with increasing H-2 flow ratio, respectively. As a result, the AZO/H films grown with 2% H-2 addition showed excellent electrical properties with a resistivity of 4.98 x 10(4) Omega cm. The UV-measurements showed that the optical transmission of the AZO/H films was > 85% in the visible range with a wide optical band gap. In addition, the effect of H-2 flow ratio on the structure and composition of hydrogenated AZO thin films have also been studied.
Keywords
TIN-OXIDE-FILMS; THIN-FILMS; ZINC-OXIDE; CONDUCTIVITY; DEPOSITION; SUBSTRATE; GROWTH; TIN-OXIDE-FILMS; THIN-FILMS; ZINC-OXIDE; CONDUCTIVITY; DEPOSITION; SUBSTRATE; GROWTH; ZnO; Al doping; Hydrogenated; rf magnetron sputtering
ISSN
1385-3449
URI
https://pubs.kist.re.kr/handle/201004/132105
DOI
10.1007/s10832-008-9532-0
Appears in Collections:
KIST Article > 2009
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE