Magnetic and structural properties of Fe ion-implanted GaN
- Authors
- Kim, Woochul; Kang, Hee Jae; Noh, Sam Kyu; Song, Jonghan; Kim, Chul Sung
- Issue Date
- 2007-09
- Publisher
- ELSEVIER SCIENCE BV
- Citation
- JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.316, no.2, pp.E199 - E202
- Abstract
- The magnetic and structural properties of Fe ion-implanted GaN was investigated by various measurements. XRD results did not show any peaks associated with second phase formation. The magnetization curve at 5K showed ferromagnetic behavior for 900 degrees C-annealed sample. In zero-field-cooled (ZFC) and field-cooled (FC) magnetization measurements, the irreversibility and a cusp-like behavior of the ZFC curve were observed for 900 degrees C-annealed sample. These behaviors are typically observed in superparamagnetic or spin glass phase. While the temperature dependence magnetization of 800 degrees C-annealed sample showed non-Brillouin-like curve and it is not exhibited ferromagnetic hysteresis at 5K. In XPS measurement, the coexistence of metallic Fe (Fe-0) and Fe-N bond (Fe2+ and Fe3+) for Fe 2p core level spectra is observed in as-implanted sample. But 700-900 degrees C-annealed samples showed only Fe-N bond (Fe2+ and Fe3+) spectra. For Ga 3d core level spectra only Ga-N bonds showed for as implanted with 700-900 degrees C-annealed samples. From XPS results, it could be explained that magnetic property of our films originated from FeN structures. (c) 2007 Elsevier B.V. All rights reserved.
- Keywords
- THIN-FILMS; SEMICONDUCTORS; FERROMAGNETISM; GROWTH; CO; CR; GE; THIN-FILMS; SEMICONDUCTORS; FERROMAGNETISM; GROWTH; CO; CR; GE; ion implantation; magnetic semiconductor
- ISSN
- 0304-8853
- URI
- https://pubs.kist.re.kr/handle/201004/134159
- DOI
- 10.1016/j.jmmm.2007.04.025
- Appears in Collections:
- KIST Article > 2007
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