A nonvolatile memory based on reversible phase changes between fcc and hcp
- Authors
- Ahn, DH; Kang, DH; Cheong, BK; Kwon, HS; Kwon, MH; Lee, TY; Jeong, JH; Lee, TS; Kim, IH; Kim, KB
- Issue Date
- 2005-05
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE ELECTRON DEVICE LETTERS, v.26, no.5, pp.286 - 288
- Abstract
- A nonvolatile memory technology utilizing reversible changes between fcc and hcp crystalline phases is proposed. In this new type of phase-change memory, data are stored in different forms of crystalline phases of (Ge1Sb2Te4)(0.8)(Sn1Bi2Te4)(0.2) chalcogenide alloy. RESET operation produces the less conductive metastable fcc phase via melt-quenching from the more conductive stable hep phase and SET operation involves a phase change from fcc directly to hcp. Both RESET and SET operations can be completed as fast as 70 ns with large changes in cell resistance.
- Keywords
- THIN-FILM; THIN-FILM; amorphous semiconductor; chalcogenide; non-volatile memory; phase transformation; phase-change memory (PCM)
- ISSN
- 0741-3106
- URI
- https://pubs.kist.re.kr/handle/201004/136523
- DOI
- 10.1109/LED.2005.846576
- Appears in Collections:
- KIST Article > 2005
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