A nonvolatile memory based on reversible phase changes between fcc and hcp

Authors
Ahn, DHKang, DHCheong, BKKwon, HSKwon, MHLee, TYJeong, JHLee, TSKim, IHKim, KB
Issue Date
2005-05
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE ELECTRON DEVICE LETTERS, v.26, no.5, pp.286 - 288
Abstract
A nonvolatile memory technology utilizing reversible changes between fcc and hcp crystalline phases is proposed. In this new type of phase-change memory, data are stored in different forms of crystalline phases of (Ge1Sb2Te4)(0.8)(Sn1Bi2Te4)(0.2) chalcogenide alloy. RESET operation produces the less conductive metastable fcc phase via melt-quenching from the more conductive stable hep phase and SET operation involves a phase change from fcc directly to hcp. Both RESET and SET operations can be completed as fast as 70 ns with large changes in cell resistance.
Keywords
THIN-FILM; THIN-FILM; amorphous semiconductor; chalcogenide; non-volatile memory; phase transformation; phase-change memory (PCM)
ISSN
0741-3106
URI
https://pubs.kist.re.kr/handle/201004/136523
DOI
10.1109/LED.2005.846576
Appears in Collections:
KIST Article > 2005
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