Tunneling magnetoresistance of nano-scale magnetic tunnel junctions
- Authors
- Park, SY; Lee, JH; Shin, IJ; Hong, JP; Shin, KH; Phie, K; Lee, BC
- Issue Date
- 2004-06
- Publisher
- WILEY-V C H VERLAG GMBH
- Citation
- PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, no.8, pp.1692 - 1695
- Abstract
- Nano-size magnetic tunnel junctions (MTJs) were fabricated by using e-beam lithography and oxidizing the top ferromagnetic (free) layer with inductively coupled plasma while the junction area was covered with PR. A significant improvement in the physical properties of the MTJ has been observed compared to those patterned by conventional methods. The tunnelling magnetoresistance (TMR) was 31% for 140 x 140 nm(2) MTJ at room temperature. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
- Keywords
- TEMPERATURE; TEMPERATURE; Tunneling magnetoresistance
- ISSN
- 0031-8965
- URI
- https://pubs.kist.re.kr/handle/201004/137571
- DOI
- 10.1002/pssa.200304678
- Appears in Collections:
- KIST Article > 2004
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