Implementation of a piezoresistive MEMS cantilever for nanoscale force measurement in micro/nano robotic applications
- Authors
- Kim, DH; Kim, B; Park, JO
- Issue Date
- 2004-05
- Publisher
- KOREAN SOC MECHANICAL ENGINEERS
- Citation
- KSME INTERNATIONAL JOURNAL, v.18, no.5, pp.789 - 797
- Abstract
- The nanoscale sensing and manipulation have become a challenging issue in micro/nanorobotic applications. In particular, a feedback sensor-based manipulation is necessary for realizing an efficient and reliable handling of particles under uncertain environment in a micro/nano scale. This paper presents a piezoresistive MEMS cantilever for nanoscale force measurement in microrobotics. A piezoresistive MEMS cantilever enables sensing of gripping and contact forces in nanonewton resolution by measuring changes in the stress-induced electrical resistances. The calibration of a piezoresistive MEMS cantilever is experimentally carried out. In addition, as part of the work on nanomanipulation with a piezoresistive MEMS cantilever, the analysis on the interaction forces between a tip and a material, and the associated manipulation strategies are investigated. Experiments and simulations show that a piezoresistive MEMS cantilever integrated into a microrobotic system can be effectively used in nanoscale force measurements and a sensor-based manipulation.
- Keywords
- MICROMANIPULATION; NANOROBOTICS; MICROSCOPE; MICROMANIPULATION; NANOROBOTICS; MICROSCOPE; piezoresistive MEMS cantilever; atomic force microscope (AFM); microrobotics; micro force sensing; van der Waals force; micro/nano -manipulation
- ISSN
- 1226-4865
- URI
- https://pubs.kist.re.kr/handle/201004/137633
- Appears in Collections:
- KIST Article > 2004
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