DSpace at KIST: Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis

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DC Field	Value	Language
dc.contributor.author	이연희	-
dc.date.accessioned	2024-01-21T07:44:27Z	-
dc.date.available	2024-01-21T07:44:27Z	-
dc.date.created	2022-01-10	-
dc.date.issued	2003-12	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/138017	-
dc.title	Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis	-
dc.title.alternative	표면분석을 위한 비행시간형 이차이온질량분석법 (TOF-SIMS)	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	화학세계, v.12, pp.24 - 29	-
dc.citation.title	화학세계	-
dc.citation.volume	12	-
dc.citation.startPage	24	-
dc.citation.endPage	29	-
dc.subject.keywordAuthor	TOF-SIMS	-
dc.subject.keywordAuthor	surface analysis	-
dc.subject.keywordAuthor	ion gun	-

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