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Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis

Other Titles

표면분석을 위한 비행시간형 이차이온질량분석법 (TOF-SIMS)

Authors

이연희

Issue Date

2003-12

Citation

화학세계, v.12, pp.24 - 29

Keywords

TOF-SIMS; surface analysis; ion gun

URI

https://pubs.kist.re.kr/handle/201004/138017

Appears in Collections:

KIST Article > 2003

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