Microwave dielectric characteristics of 0.75(Al1/2Ta1/2)O-2-0.25(Ti1-xSnx)O-2 ceramics

Authors
Choi, JWHa, JYYoon, SJKim, HJYoon, KH
Issue Date
2003-09
Publisher
ELSEVIER SCI LTD
Citation
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, v.23, no.14, pp.2507 - 2510
Abstract
The microwave dielectric characteristics of 0.75(Al1/2Ta1/2)O-2-0.25(Ti1-xSnx)O-2 ceramics were investigated. The microwave dielectric properties of 0.75(Al1/2Ta1/2)O-2-0.25TiO(2) sintered at 1450 degreesC exhibited a dielectric constant (epsilon(r)) of 31.2, a Q.f(0) of 54,590 GHz, and the temperature coefficient of resonant frequency (tau(f)) of +12.8 ppm/degreesC. To control of the tau(f) and enhance the Q.f(0) for 0.75(Al1/2Ta1/2)O-2-0.25TiO(2), Sn4+ was substituted for Ti4+. With an increase of Sri content from 5 to 50 mol%, the epsilon(r) slightly decreased, the Q.f(0) increased and the tau(f) shifted from positive to negative value. The tau(f) within +/-10 ppm/degreesC of zero was realized for the Sri content below 30 mol% and the microwave dielectric properties had the epsilon(r) value of 31.2-26.3, the Q.f(0) of 54,600-70,700 GHz, and tau(f) of +12.8--9.3 ppm/degreesC for this compositions. The relationship between microstructure and microwave dielectric characteristics was investigated. (C) 2003 Elsevier Ltd. All rights reserved.
Keywords
RESONATOR; RESONATOR; dielectric constant; microwave ceramics; quality factor; (Al,Ta)O-2; (Ti,Sn)O-2
ISSN
0955-2219
URI
https://pubs.kist.re.kr/handle/201004/138300
DOI
10.1016/S0955-2219(03)00170-5
Appears in Collections:
KIST Article > 2003
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