Temperature dependent electrical properties in ITO/TPD/Alq(3)/Al organic light-emitting diodes

Authors
Kim, SKChung, DHLee, HSCho, HNPark, JWHong, JWKim, TW
Issue Date
2003-04-04
Publisher
ELSEVIER SCIENCE SA
Citation
SYNTHETIC METALS, v.137, no.1-3, pp.1041 - 1042
Abstract
Temperature dependence of current-voltage-luminance characteristics in organic light-emitting diodes are studied in a device structure of ITO/TPD/Alq(3)/Al to understand an electrical conduction mechanism. The current-voltage-luminance characteristics are measured in the temperature range of 8Ksimilar to300K, and analyzed them using a hopping model with exponential trap distribution and Fowler-Nordheim tunneling. At low temperatures below 150K, the Fowler-Nordheim tunneling conduction mechanism is dominant. And we have obtained a zero field barrier height to be about 0.6similar to0.8eV
Keywords
DEVICES; DEVICES; organic light-emitting diodes; conduction mechanism; hopping model; Fowler-Nordheim tunneling
ISSN
0379-6779
URI
https://pubs.kist.re.kr/handle/201004/138651
DOI
10.1016/S0379-6779(02)00895-0
Appears in Collections:
KIST Article > 2003
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