Analytic model for photo-response of p-channel MODFET'S
- Authors
- Kim, HJ; Han, I; Choi, WJ; Park, YJ; Cho, WJ; Lee, JI; Kim, DM; Zimmermann, J
- Issue Date
- 2003-02
- Publisher
- KOREAN PHYSICAL SOC
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.42, pp.S642 - S646
- Abstract
- In this article we propose a comprehensive physical model for the photo-response of MODFET's and analyze the experimental results for p-channel InGaP/GaAs/InGaAs double heterojunction pseudomorphic MODFET's. The analytic model is based on the quantum nature of the two-dimensional carrier statistics in the channel and the recently developed device equation for tit(gate current. The model predicts a power law relationship between the current ratio with and without optical illumination, and the optical intensity, and successfully explains the experimental results. The gate voltage dependence of the effective ideality factor for the whole gate structure was extracted and discussed.
- Keywords
- FIELD-EFFECT TRANSISTOR; LOW-FREQUENCY NOISE; WAVE-FUNCTION; GATE LEAKAGE; QUANTUM-WELL; CAD MODEL; HEMT; ILLUMINATION; CONDUCTION; FIELD-EFFECT TRANSISTOR; LOW-FREQUENCY NOISE; WAVE-FUNCTION; GATE LEAKAGE; QUANTUM-WELL; CAD MODEL; HEMT; ILLUMINATION; CONDUCTION; MODFET' s; photo-response; gate current; ideality factor; thresbold voltage; drain current; two-dimensional electron (hole) gas
- ISSN
- 0374-4884
- URI
- https://pubs.kist.re.kr/handle/201004/138879
- Appears in Collections:
- KIST Article > 2003
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.