Analytic model for photo-response of p-channel MODFET'S

Authors
Kim, HJHan, IChoi, WJPark, YJCho, WJLee, JIKim, DMZimmermann, J
Issue Date
2003-02
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.42, pp.S642 - S646
Abstract
In this article we propose a comprehensive physical model for the photo-response of MODFET's and analyze the experimental results for p-channel InGaP/GaAs/InGaAs double heterojunction pseudomorphic MODFET's. The analytic model is based on the quantum nature of the two-dimensional carrier statistics in the channel and the recently developed device equation for tit(gate current. The model predicts a power law relationship between the current ratio with and without optical illumination, and the optical intensity, and successfully explains the experimental results. The gate voltage dependence of the effective ideality factor for the whole gate structure was extracted and discussed.
Keywords
FIELD-EFFECT TRANSISTOR; LOW-FREQUENCY NOISE; WAVE-FUNCTION; GATE LEAKAGE; QUANTUM-WELL; CAD MODEL; HEMT; ILLUMINATION; CONDUCTION; FIELD-EFFECT TRANSISTOR; LOW-FREQUENCY NOISE; WAVE-FUNCTION; GATE LEAKAGE; QUANTUM-WELL; CAD MODEL; HEMT; ILLUMINATION; CONDUCTION; MODFET' s; photo-response; gate current; ideality factor; thresbold voltage; drain current; two-dimensional electron (hole) gas
ISSN
0374-4884
URI
https://pubs.kist.re.kr/handle/201004/138879
Appears in Collections:
KIST Article > 2003
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