Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, JH | - |
dc.contributor.author | Yoon, KH | - |
dc.contributor.author | Kim, TS | - |
dc.date.accessioned | 2024-01-21T09:43:39Z | - |
dc.date.available | 2024-01-21T09:43:39Z | - |
dc.date.created | 2022-01-10 | - |
dc.date.issued | 2002-11 | - |
dc.identifier.issn | 1058-4587 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/139084 | - |
dc.description.abstract | Micromachined piezoelectric cantilevers have been fabricated using PZT (52/58) films. Electromechanical characteristics of micromachined PZT cantilever were measured by laser vibrometer system as a function of cantilever length for the cantilever with two different supported layer thickness respectively. The 1(st) version unimorph cantilever consists of a 0.6 (square)-thick PZT layer on 1.5 (square)-thick SiN x elastic supported layer. In order to increase Q-factor in air and liquid, from calculated spring constant as a function of variable supporting layer thickness, 2(nd) version cantilever was designed to have a 0.8 (square)-thick PZT layer on 4.5 (square)-thick SiNx/Si elastic supported layer. The gravimetric sensitivities of cantilever in air were characterized by Au deposition on the backside of cantilever. The gravimetric sensitivity of 100x200 (square)-dimension cantilever was 300 cm(2)/g and the mass of 5 ng was detectable. | - |
dc.language | English | - |
dc.publisher | TAYLOR & FRANCIS LTD | - |
dc.subject | THIN-FILM | - |
dc.title | Characterization of resonant behavior and sensitivity using micromachined PZT cantilever | - |
dc.type | Article | - |
dc.identifier.doi | 10.1080/10584580290172071 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | INTEGRATED FERROELECTRICS, v.50, pp.43 - 52 | - |
dc.citation.title | INTEGRATED FERROELECTRICS | - |
dc.citation.volume | 50 | - |
dc.citation.startPage | 43 | - |
dc.citation.endPage | 52 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000179831600007 | - |
dc.identifier.scopusid | 2-s2.0-3843049583 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordAuthor | piezoelectric | - |
dc.subject.keywordAuthor | MEMS | - |
dc.subject.keywordAuthor | cantilever | - |
dc.subject.keywordAuthor | PZT | - |
dc.subject.keywordAuthor | electromechanical | - |
dc.subject.keywordAuthor | sensitivity | - |
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