Characterization of resonant behavior and sensitivity using micromachined PZT cantilever
- Authors
 - Lee, JH; Yoon, KH; Kim, TS
 
- Issue Date
 - 2002-11
 
- Publisher
 - TAYLOR & FRANCIS LTD
 
- Citation
 - INTEGRATED FERROELECTRICS, v.50, pp.43 - 52
 
- Abstract
 - Micromachined piezoelectric cantilevers have been fabricated using PZT (52/58) films. Electromechanical characteristics of micromachined PZT cantilever were measured by laser vibrometer system as a function of cantilever length for the cantilever with two different supported layer thickness respectively. The 1(st) version unimorph cantilever consists of a 0.6 (square)-thick PZT layer on 1.5 (square)-thick SiN x elastic supported layer. In order to increase Q-factor in air and liquid, from calculated spring constant as a function of variable supporting layer thickness, 2(nd) version cantilever was designed to have a 0.8 (square)-thick PZT layer on 4.5 (square)-thick SiNx/Si elastic supported layer. The gravimetric sensitivities of cantilever in air were characterized by Au deposition on the backside of cantilever. The gravimetric sensitivity of 100x200 (square)-dimension cantilever was 300 cm(2)/g and the mass of 5 ng was detectable.
 
- Keywords
 - THIN-FILM; THIN-FILM; piezoelectric; MEMS; cantilever; PZT; electromechanical; sensitivity
 
- ISSN
 - 1058-4587
 
- URI
 - https://pubs.kist.re.kr/handle/201004/139084
 
- DOI
 - 10.1080/10584580290172071
 
- Appears in Collections:
 - KIST Article > 2002
 
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