Characterization of resonant behavior and sensitivity using micromachined PZT cantilever
- Authors
- Lee, JH; Yoon, KH; Kim, TS
- Issue Date
- 2002-11
- Publisher
- TAYLOR & FRANCIS LTD
- Citation
- INTEGRATED FERROELECTRICS, v.50, pp.43 - 52
- Abstract
- Micromachined piezoelectric cantilevers have been fabricated using PZT (52/58) films. Electromechanical characteristics of micromachined PZT cantilever were measured by laser vibrometer system as a function of cantilever length for the cantilever with two different supported layer thickness respectively. The 1(st) version unimorph cantilever consists of a 0.6 (square)-thick PZT layer on 1.5 (square)-thick SiN x elastic supported layer. In order to increase Q-factor in air and liquid, from calculated spring constant as a function of variable supporting layer thickness, 2(nd) version cantilever was designed to have a 0.8 (square)-thick PZT layer on 4.5 (square)-thick SiNx/Si elastic supported layer. The gravimetric sensitivities of cantilever in air were characterized by Au deposition on the backside of cantilever. The gravimetric sensitivity of 100x200 (square)-dimension cantilever was 300 cm(2)/g and the mass of 5 ng was detectable.
- Keywords
- THIN-FILM; THIN-FILM; piezoelectric; MEMS; cantilever; PZT; electromechanical; sensitivity
- ISSN
- 1058-4587
- URI
- https://pubs.kist.re.kr/handle/201004/139084
- DOI
- 10.1080/10584580290172071
- Appears in Collections:
- KIST Article > 2002
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