DSpace at KISTKIST Article2001

Full metadata record

DC Field Value Language
dc.contributor.authorPark, YJ-
dc.contributor.authorJoo, YC-
dc.date.accessioned2024-01-21T12:15:15Z-
dc.date.available2024-01-21T12:15:15Z-
dc.date.created2021-09-05-
dc.date.issued2001-05-25-
dc.identifier.issn1359-6462-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/140473-
dc.languageEnglish-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subjectCONFINED METAL LINES-
dc.subjectINDUCED FAILURE-
dc.subjectINTERCONNECTS-
dc.subjectEVOLUTION-
dc.subjectRELIABILITY-
dc.subjectDEPENDENCE-
dc.subjectSIMULATION-
dc.titleElectromigration-induced stress interaction between vias and polygranular clusters-
dc.typeArticle-
dc.identifier.doi10.1016/S1359-6462(01)00674-1-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSCRIPTA MATERIALIA, v.44, no.10, pp.2497 - 2501-
dc.citation.titleSCRIPTA MATERIALIA-
dc.citation.volume44-
dc.citation.number10-
dc.citation.startPage2497-
dc.citation.endPage2501-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000169857600020-
dc.identifier.scopusid2-s2.0-0035946870-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.type.docTypeArticle-
dc.subject.keywordPlusCONFINED METAL LINES-
dc.subject.keywordPlusINDUCED FAILURE-
dc.subject.keywordPlusINTERCONNECTS-
dc.subject.keywordPlusEVOLUTION-
dc.subject.keywordPlusRELIABILITY-
dc.subject.keywordPlusDEPENDENCE-
dc.subject.keywordPlusSIMULATION-
dc.subject.keywordAuthorelectromigration-
dc.subject.keywordAuthorcomputer simulation-
dc.subject.keywordAuthorinterconnects-
dc.subject.keywordAuthoraluminum-
Appears in Collections:
KIST Article > 2001
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE