Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Choi, SC | - |
dc.contributor.author | Park, YW | - |
dc.contributor.author | Choi, WK | - |
dc.contributor.author | Kim, KH | - |
dc.contributor.author | Cho, JS | - |
dc.contributor.author | Han, S | - |
dc.contributor.author | Cho, J | - |
dc.contributor.author | Jung, S | - |
dc.contributor.author | Han, YG | - |
dc.contributor.author | Yoo, BK | - |
dc.contributor.author | Jung, HJ | - |
dc.contributor.author | Koh, SK | - |
dc.date.accessioned | 2024-01-21T16:31:25Z | - |
dc.date.available | 2024-01-21T16:31:25Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 1998-12 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/142711 | - |
dc.description.abstract | High-quality ZnO film and highly wettable polymethylmethacrylate (PMMA) are obtained by using a keV inn beam. ZnO films are grown on glass substrates by ion beam sputter deposition. changing the oxygen/argon gas ratio, ion beam energy, and substrate temperature. Physical properties of ZnO films were investigated by X-ray diffraction, Rutherford backscattering spectroscopy, and the Van der Pauw method. All the films show a strong preferred orientation along the c-axis. The electrical resistivity is varied from 10(-3) to 10(6) Omega cm and its dependence on the deposition parameters is discussed. The PMMA surface was modified by the ion-assisted reaction technique. Ion dose, ion energy, and oxygen gas now rate are varied from 5 x 10(15) to 1 x 10(17) ions/cm(2), from 0.6 to 1.2 kV, and from 0 to 8 ml/min, respectively. A highly wettable PMMA surface can be obtained by irradiating oxygen ions in an oxygen gas environment. X-ray photoelectron spectroscopic analysis shows that hydrophilic groups are formed on the surface of PMMA. | - |
dc.language | English | - |
dc.publisher | JAPAN J APPLIED PHYSICS | - |
dc.title | Thin film growth and surface modification by keV ion beam | - |
dc.type | Article | - |
dc.identifier.doi | 10.1143/JJAP.37.6984 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.37, no.12B, pp.6984 - 6990 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | - |
dc.citation.volume | 37 | - |
dc.citation.number | 12B | - |
dc.citation.startPage | 6984 | - |
dc.citation.endPage | 6990 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000078699200064 | - |
dc.identifier.scopusid | 2-s2.0-0002820783 | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | ion beam modification | - |
dc.subject.keywordAuthor | ion beam sputter deposition | - |
dc.subject.keywordAuthor | ZnO thin film | - |
dc.subject.keywordAuthor | polymethylmethacrylate | - |
dc.subject.keywordAuthor | wettability | - |
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