Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction

Authors
Na, JGPark, CHHeo, NHLee, SRKim, JPark, K
Issue Date
1998-10
Publisher
KLUWER ACADEMIC PUBL
Citation
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.9, no.5, pp.323 - 326
Abstract
Cobalt ferrite/metal composite thin films with a saturation magnetization (M-s) of similar to 0.729 Weber m(-2) were prepared by a reactive sputtering method. The M-s of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures ( >300 degrees C), CoxFe1-x (x approximate to 0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a(0) = 0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x (x approximate to 0.62) with a b.c.c. structure (a(0) = 0.289 nm) and a space group of lm3m. (C) 1998 Kluwer Academic Publishers.
Keywords
PATTERNS; PATTERNS; thin films
ISSN
0957-4522
URI
https://pubs.kist.re.kr/handle/201004/142846
DOI
10.1023/A:1008998800655
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KIST Article > Others
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