Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction
- Authors
 - Na, JG; Park, CH; Heo, NH; Lee, SR; Kim, J; Park, K
 
- Issue Date
 - 1998-10
 
- Publisher
 - KLUWER ACADEMIC PUBL
 
- Citation
 - JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.9, no.5, pp.323 - 326
 
- Abstract
 - Cobalt ferrite/metal composite thin films with a saturation magnetization (M-s) of similar to 0.729 Weber m(-2) were prepared by a reactive sputtering method. The M-s of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures ( >300 degrees C), CoxFe1-x (x approximate to 0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a(0) = 0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x (x approximate to 0.62) with a b.c.c. structure (a(0) = 0.289 nm) and a space group of lm3m. (C) 1998 Kluwer Academic Publishers.
 
- Keywords
 - PATTERNS; PATTERNS; thin films
 
- ISSN
 - 0957-4522
 
- URI
 - https://pubs.kist.re.kr/handle/201004/142846
 
- DOI
 - 10.1023/A:1008998800655
 
- Appears in Collections:
 - KIST Article > Others
 
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