DSpace at KIST: Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS)

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DC Field	Value	Language
dc.contributor.author	이연희	-
dc.contributor.author	한승희	-
dc.date.accessioned	2024-01-21T18:03:32Z	-
dc.date.available	2024-01-21T18:03:32Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1997-10	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/143576	-
dc.title	Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS)	-
dc.title.alternative	TOF-SIMS를 이용한 표면분석	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	Analytical science and technology, v.10, no.5, pp.87A - 104A	-
dc.citation.title	Analytical science and technology	-
dc.citation.volume	10	-
dc.citation.number	5	-
dc.citation.startPage	87A	-
dc.citation.endPage	104A	-
dc.subject.keywordAuthor	TOF-SIMS	-
dc.subject.keywordAuthor	Surface analysis	-
dc.subject.keywordAuthor	Polymer	-
dc.subject.keywordAuthor	Depth profile	-
dc.subject.keywordAuthor	Imaging	-

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