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Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS)

Other Titles

TOF-SIMS를 이용한 표면분석

Authors

이연희; 한승희

Issue Date

1997-10

Citation

Analytical science and technology, v.10, no.5, pp.87A - 104A

Keywords

TOF-SIMS; Surface analysis; Polymer; Depth profile; Imaging

URI

https://pubs.kist.re.kr/handle/201004/143576

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KIST Article > Others

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