Auger electron spectroscopy investigation of the chemical shifts of tin and tin oxides

Authors
Choi, WKCho, JSCho, JChoi, SCJung, HJKoh, SKLee, CMJeong, K
Issue Date
1997-08
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.31, no.2, pp.369 - 372
Abstract
The Auger spectra of tin, the oxides SnO2, and the nonstoichiometric SnOx thin films grown by reactive ion-assisted deposition have been studied. The Anger transition peaks of O K L2,3L2,3 and Sn M4N4,5N4,5 were used to determine the surface composition and Sn valency for the different tin oxides. Chemical shifts on the order of 1.08-1.1 eV per Sn valency were observed.
Keywords
PARAMETERS; PARAMETERS; reactive ion-assisted deposition
ISSN
0374-4884
URI
https://pubs.kist.re.kr/handle/201004/143684
Appears in Collections:
KIST Article > Others
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