Auger electron spectroscopy investigation of the chemical shifts of tin and tin oxides
- Authors
- Choi, WK; Cho, JS; Cho, J; Choi, SC; Jung, HJ; Koh, SK; Lee, CM; Jeong, K
- Issue Date
- 1997-08
- Publisher
- KOREAN PHYSICAL SOC
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.31, no.2, pp.369 - 372
- Abstract
- The Auger spectra of tin, the oxides SnO2, and the nonstoichiometric SnOx thin films grown by reactive ion-assisted deposition have been studied. The Anger transition peaks of O K L2,3L2,3 and Sn M4N4,5N4,5 were used to determine the surface composition and Sn valency for the different tin oxides. Chemical shifts on the order of 1.08-1.1 eV per Sn valency were observed.
- Keywords
- PARAMETERS; PARAMETERS; reactive ion-assisted deposition
- ISSN
- 0374-4884
- URI
- https://pubs.kist.re.kr/handle/201004/143684
- Appears in Collections:
- KIST Article > Others
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